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MI 3100 s, MI 3100 SE EurotestEASI Measurements
26
Trip-out times according to EN 60364-4-41:
½I
N*) I
N 2I
N 5IN
General RCDs
(non-delayed) t> 999 ms t< 999 ms t< 150 ms t< 40 ms
Selective RCDs
(time-delayed) t> 999 ms 130 ms < t< 999 ms 60 ms < t< 200 ms 50 ms < t< 150 ms
Trip-out times according to BS 7671:
½I
N*) I
N 2I
N 5IN
General RCDs
(non-delayed) t> 1999 ms t< 300 ms t< 150 ms t< 40 ms
Selective RCDs
(time-delayed) t> 1999 ms 130 ms < t< 500 ms 60 ms < t< 200 ms 50 ms < t< 150 ms
Trip-out times according to AS/NZS 3017**):
½IN*) I
N 2I
N 5I
N
RCD type IN [mA] t t
t
t
Note
I 10
> 999 ms
40 ms 40 ms 40 ms
Maximum break time
II > 10 30 300 ms 150 ms 40 ms
III > 30 300 ms 150 ms 40 ms
IV
S > 30 > 999 ms 500 ms 200 ms 150 ms
130 ms 60 ms 50 ms Minimum non-actuating time
*) Minimum test period for current of ½IN, RCD shall not trip-out.
**) Test current and measurement accuracy correspond to AS/NZS 3017 requirements.
Maximum test times related to selected test current for general (non-delayed) RCD
Standard ½I
N I
N 2IN 5I
N
EN 61008 / EN 61009 300 ms 300 ms 150 ms 40 ms
EN 60364-4-41 1000 ms 1000 ms 150 ms 40 ms
BS 7671 2000 ms 300 ms 150 ms 40 ms
AS/NZS 3017 (I, II, III) 1000 ms 1000 ms 150 ms 40 ms
Maximum test times related to selected test current for selective (time-delayed) RCD
Standard ½I
N I
N 2IN 5I
N
EN 61008 / EN 61009 500 ms 500 ms 200 ms 150 ms
EN 60364-4-41 1000 ms 1000 ms 200 ms 150 ms
BS 7671 2000 ms 500 ms 200 ms 150 ms
AS/NZS 3017 (IV) 1000 ms 1000 ms 200 ms 150 ms
Note:
Trip-out limit times for PRCD, PRCD-K and PRCD-S are equal to General (non-delayed)
RCDs.
4.3.5 Isc factor
In this menu the Isc factor for calculation of
short circuit current in Z-LINE and Z-LOOP
measurements can be set.
Figure 4.8: Selection of Isc factor
26


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