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MI3002 MI3100 MI3102 Reduced low voltage supply systems
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C.4 Technical specifications
Only those technical specifications are listed below that are different to specifications
from chapter 8 of this document.
C.4.1 RCD testing
General data
Nominal residual current................... 10 mA, 30 mA, 100 mA, 300 mA, 500 mA,
1000 mA
Nominal residual current accuracy.... -0 / +0.1IΔ; IΔ = IΔN, 2×IΔN, 5×IΔN
-0.1IΔ / +0; IΔ = ½×IΔN
Maximum nominal differential
current for declared accuracy ........... 1000 mA for IΔN
500 mA for 2×IΔN
100 mA for 5×IΔN
Maximum test current ....................... 1 A (for Z LOOP < 1 Ω)
Test current shape............................ Sine-wave (AC), pulsed (A)
DC offset for pulsed test current ....... 6 mA typical
RCD type .......................................... general (G, non-delayed), selective (S, time-
delayed)
Test current starting polarity ............. 00 or 1800
Nominal input voltage ....................... 55 V / 63 V (45 Hz ÷ 65 Hz)
Contact voltage
Measuring range according to EN61557-6 is 3.0 V ÷ 32.6 V for limit contact voltage 25
V.
Measuring range according to EN61557-6 is 3.0 V ÷ 66.0 V for limit contact voltage 50
V. Measuring range (V) Resolution (V) Accuracy
0.0 ÷ 9.9 0.1 (-0 % / +15 %) of reading +
2 digits
10.0 ÷ 99.9 0.1 (-0 % / +15 %) of reading
Accuracy applies for 1 year in reference conditions. Temperature coeficient ouside
these limits is +1 digit.
Test current ...................................... max. 0.5×IΔN
Limit contact voltage ......................... 25 V or 50 V
The contact voltage is calculated to.. IΔN (general type) or to 2×IΔN (selective type)
Fault loop resistance at contact voltage is calculated as
N
C
LI
U
R
Δ
=.
100


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